Length and dimensional measurements at NIST
نویسندگان
چکیده
منابع مشابه
Length and Dimensional Measurements at NIST
This paper discusses the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales and gage blocks to a future of atom-based dimensional standards. Current capabilities include dimensional measurements over a range of fourteen...
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This paper reports to the international community on recent developments in technical policies, programs, and capabilities at the U.S. (United States) National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to cus...
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National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar to the wavelength of light. The history of the interferometer is recalle...
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We briefly explain the fundamentals of detector nonlinearity applicable to both electrical and optical nonlinearity measurements. We specifically discuss the attenuation method for optical nonlinearity measurement that the NIST system is based upon, and we review the possible sources of nonlinearity inherent to thermal detectors used with high-power lasers. We also describe, in detail, the NIST...
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Streak camera measurements were made at SPEAR3 to characterize longitudinal coupling impedance. For the nominal optics, data was taken at three rf voltages and a single-bunch current range of 0-20mA. Both bunchcentroid phase shift and bunch lengthening were recorded to extract values for resistive and reactive impedance. An (R+L) and a Q=1 model were then back-substituted into the Haissinski eq...
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ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 2001
ISSN: 1044-677X
DOI: 10.6028/jres.106.002